Latest ATM News: New Probe Card Cleaner Drastically Improves Probe Yields

January 1 , 2002

The PC-105 was designed in conjunction with a VLSI device manufacturer for thorough non-contact, non-abrasive cleaning of high density microspring probe cards. Thorough and proper cleaning of probe cards lowers contact resistance resulting in higher probe yields!

Non-contact, non-abrasive cleaning and drying methods also increase probe card life and reduce probe card maintenance costs. Cleaning, rinsing and drying recipes are programmable and recalled from memory. Cleaning solutions are stored in 2.0 liter bottles in the cabinet of the system. Waste is stored in a 20 liter bottle.

The PC-105 is only 29 inches wide and 22 inches deep, and requires a supply of DI water together with N2 or CDA.

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CONTACT:
Paul Gillespie at +1 (408) 416-2400